BrightSpot is Presenting at the 2026 NLR PV Reliability Workshop

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Jared Friedl will present thin-film and glass-crack defect detection using the large-area PLus-Spot photoluminescence tool in the presentation “Large-Area Photoluminescence Imaging of Thin Film Solar Panels” on Feb 25, 2026. This work was performed jointly with research staff from the National Laboratory of the Rockies.

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