Perovskite

Precision imaging for emerging
solar technologies

From R&D to Product Development to Manufacturing to Field Testing, BrightSpot can provide you with customized defect imaging solutions for Perovskite and Tandem cell/panel architectures.

BrightSpot was very responsive to our customization needs for an EL/PL system to image our Perovskite cells and mini-modules. The image quality is excellent, and the system is heavily used to provide critical feedback for our R&D efforts.

– John Iannelli, President & Founder, Caelux

Caelux Logo

The highest resolution images, from mm² to m²

BrightSpot utilizes a variety of camera and lens combinations to enable high-resolution imaging over a wide range of device sizes. Even when imaging areas wider than 1 meter, fine features smaller than 0.5 mm can easily be seen. We offer large-area LED illumination at intensities up to 1 sun to capture photoluminescence images of full panels.

Perovskite EL Image

Perovskite EL Image

Perovskite PL Image

Perovskite PL Image

Standard and Customized Imaging Systems

Imaging systems for Perovskite cells/panels range from our standard CellSpot and PanEL-Spot products, to customized system configurations tailored to your specific testing needs. 

Available components include:

Large-area cell busbar-probing chuck

Filter Wheel for IMPEL-controlled selection of camera filters

Dual-color PL Light Sources for imaging of top and bottom cells

Customized EL chuck for multiplexed probing of an array of cells

Spectrometer for spot bandgap measurement

How good are your edge and junction box seals?

Perovskites are highly sensitive to degradation from moisture and air ingress from the panel edges and junction box penetrations. BrightSpot’s UV Fluorescence technology has been demonstrated to detect such sealing failures in glass/glass panel construction. UVF should be a standard product development tool to help develop durable Perovskite panels.

Your Needs Covered

UVF Panel with Sealing Problems

UVF Panel with Sealing Problems

Spectral PL Curve

Spectral PL Curve

1-6 Photoluminescence Light Sources

CellSpot with 4x Green Lamps

Chuck for array of small cells

Chuck for array of small cells

We purchased a customized photoluminescence imaging system from BrightSpot for characterizing perovskite thin films and completed solar cells over a wide range of sizes. The system is user friendly and produces excellent PL images.

– Adam Lorenz, Co-founder and CTO, Cubic PV

cubicpv-logo

Not just pretty pictures

IMPEL’s automated recipe feature can capture a series of images at different light intensities and/or electrical biases. BrightSpot’s advanced algorithms can analyze these images to create figure of merit maps of important device parameters such as Ideality factor, Rs, iVoc, and PCE.

IMPEL’s automated recipe feature can capture a series of images at different light intensities and/or electrical biases. BrightSpot’s advanced algorithms can analyze these images to create figure of merit maps of important device parameters such as Ideality factor, Rs, iVoc, and PCE.

Integrate Seamlessly with Factory Automation

Quality control after each fabrication step

Non-contact PL imaging should be performed after each critical step in device fabrication: after Perovskite deposition, after transport layer deposition, and after device completion. Imaging after each step facilitates not only process step optimization, but also statistical process control in manufacturing.

Perovskite PL Image

Measure device stability over time

Multi-step recipes in IMPEL enable automatic capture of images over time as devices degrade while exposed to illumination, electrical bias, and other stress factors. 

Perovskite

BrightSpot built a customized EL/PL system for Swift Solar for imaging defects and quantifying quality on both our Perovskite top junctions and the underlying silicon cells.  The system is heavily used on a daily basis and is critical to our product development efforts.

– Tomas Leijtens, Co-founder and CTO, Swift Solar

Swift Solar logo

Your Reasearch and Development Partner

As perovskite and tandem (multi-junction) solar cells move from research to early manufacturing, non-contact inspection becomes critical. BrightSpot’s EL and PL systems offer powerful, safe imaging tools for visualizing subcell performance, material defects, and layer consistency across new architectures.

CellSpot EL/PL

Discover CellSpot EL/PL

EL/PL Tool for Photovoltaic R&D and Manufacturing

Discover PanEL-Spot

Discover PanEL-Spot

Laboratory system for EL imaging of solar cells & panels

Discover Custom Solutions

BrightSpot offers customized imaging systems for factory line and robotic integration, offline testing, varied panel orientation and shape, and tight working distance constraints.

Custom Solutions

IMPEL Software

Control

IMPEL is the unified control platform for BrightSpot imaging systems, enabling seamless coordination of the camera, light sources, and power supplies. From a single interface, users can adjust exposure settings, trigger PL or EL sequences, and save all control and post-processing parameters in a convenient “Recipe” format.

Enterprise System Integration

Our software engineering team will customize IMPEL to integrate with your upstream/downstream automation equipment and to save data in a desired location and format.

Report

Built-in image processing tools help users enhance contrast to highlight defects and visualize subtle variations in cell or panel quality.

IMPEL Software Preview

decades of experience and hundreds of customers

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Publications

Here you’ll find white papers, case studies, and expert commentary designed to provide practical takeaways for professionals and decision-makers

Customized Defect Imaging Solutions for Perovskite and Tandem Cell/Panel Architectures

UV Fluorescence Imaging Of Defects And Bill Of Materials Variations In Bifacial Solar Panels

EUPVSEC – Bilbao, Spain – Sep 22, 2025

Ultraviolet Fluorescence Imaging for Photovoltaic Module Metrology: Best Practices and Survey of Features Observed in Fielded Modules

IEEE Journal of Photovoltaics ( Volume: 15, Issue: 3, May 2025)

Low-Cost Daytime Electroluminescence Imaging

NREL PV Reliability Workshop – Lakewood, CO USA – Mar 6, 2025

UV Fluorescence Imaging for Solar Panel Product Development and Durability Testing

NREL PV Reliability Workshop – Lakewood, CO USA – Feb 28, 2024

Unveiling the Unseen: Harnessing UV Fluorescence for Comprehensive Rooftop PV System Assessment and Successful Insurance Claims Process

NREL PV Reliability Workshop – Lakewood, CO USA – Feb 28, 2024

Detection and Impact of Cracks Hidden Near Interconnect Wires in Silicon Solar Cells

50th IEEE PVSC, Jun 12 2023