Electroluminescence camera systems are available for imaging cracked cells and other defects in still images or video. Solutions are available for the lab from small R&D cells to full modules, and travel systems are available for outdoor testing. Systems come with a camera, filters, lens, tripod or stand, laptop/tablet computer, power supply, MC4 cables to place between power supply and solar panel, and instructions for use and image enhancement. Our IMPEL software controls the camera and power supply, enhances the images, and even enables Daytime EL capture.
EL-Camera Lab System
Low-cost imaging of defects in solar cells and solar panels
EL-Camera Travel System
Outdoor tripod and tablet based system for EL imaging of PV arrays
UVF is a fast method to detect cell cracks and hot spots in aged modules. We offer a low-cost handheld flashlight kit for detection by eye, and a high-throughput camera flash based system which can image up to 1000 modules/hour.
Basic UV Fluorescence Kit
Small hardcase with filtered UV Flashlight, eye protection, and spare batteries. Shine on aged modules at night to detect cracked cells and other defects. No disconnection of modules needed.
UVF-Spot
High throughput UV Fluorescence system for testing up to 1000 modules/hour by pole mount camera and flash. No disconnection of modules needed. Hardcase with camera, filtered flash unit, tall handheld monopod shoulder harness, and remote display.
CellSpot-EL/PL
EL/PL Wafer and Cell Tester
Budget-priced system uses safe green, red or NIR LED PL light sources and a high resolution camera within a lightproof enclosure to obtain contactless images of wafers and partially/fully processed cells. Multiple light sources can be configured to look at minimodules or portions of large modules. Light sources are available separately. Cell probing stages are available for EL of full size silicon or tandem cells, and customized probing stages are available for thin-film cells with contacts on the rear side.
ContactSpot
- Fast measurement of contact resistivity for solar cell grid structures
- More accurate and lower variability than using manual probing
- Advanced algorithms for voltage drop down narrow fingers, for current spreading through the wafer thickness, and for non-destructive testing of circular structures.
- Also measures line resistivity.