Electroluminescence camera systems are available for imaging cracked cells and other defects in still images or video. Solutions are available for the lab from small R&D cells to full modules, and travel systems are available for outdoor testing. Systems come with a modified DSLR camera, filters, lens, tripod or stand, laptop or tablet computer, power supply, MC4 cables to place between power supply and solar panel, and instructions for use and image enhancement.
- Fast measurement of contact resistivity for solar cell grid structures
- More accurate and lower variability than using manual probing
- Advanced algorithms for voltage drop down narrow fingers, for current spreading through the wafer thickness, and for non-destructive testing of circular structures.
- Also measures line resistivity.
UVF is a fast method to detect cell cracks and hot spots in aged modules. We offer a low-cost handheld flashlight kit for detection by eye, and a high-throughput camera flash based system which can image up to 1000 modules/hour.
Small hardcase with filtered UV Flashlight, eye protection, and spare batteries. Shine on aged modules at night to detect cracked cells and other defects. No disconnection of modules needed.
High throughput UVF camera-flash based system for testing up to 1000 modules/hour by pole mount or 5000 modules/hour by drone. No disconnection of modules needed. Hardcase with camera, filtered flash unit, tall handheld monopod and harness, UV flashlight, tripod, and GPS.
Photoluminescence Wafer and Cell Tester
Budget-priced PL system uses safe red LED light source and a high resolution PL camera within a lightproof enclosure, to obtain contactless images of wafers and cells. Can be configured to look at a single cell within a module. Light sources available separately. Cell probing stage available for EL.
Solar Panel Crack Detector and Mechanical Load Tester
The LoadSpot performs static and cyclic (dynamic) load tests for standard IEC certification testing. Bending tests are performed by applying vacuum or air pressure to the rear side of the module, leaving the front side open for EL and IV testing.