Precision Imaging
Systems for PV Testing

EL, PL, UVF, and Contact Resistance tools designed for labs, manufacturing and the field

At BrightSpot Automation, we design specialized imaging and electrical measurement systems for photovoltaic testing—spanning EL (electroluminescence), PL (photoluminescence), UVF (ultraviolet fluorescence), and contact resistivity. Our tools are used across the full PV lifecycle: from early-stage R&D to scaled manufacturing, on-site installation validation, and end-of-life diagnostics.

Precision Imaging & Measurement Tools for Photovoltaics

From Terrestrial to Space PV, from Silicon to Perovskites, from R&D to field testing, we provide the Solar Energy Industry with specialized manufacturing and measurement tools.

EL/PL Imaging Systems

Reveal hidden defects, cracks, and junction issues with EL/PL imaging. These tools are optimized for every part of the PV value chain.

Ultraviolet Fluorescence (UVF)

UVF is a high-throughput, non-contact method of imaging defects and bill of material variations in solar panels.

Measure critical resistivities between gridlines and silicon or layer sheet resistivities

ContactSpot

Measure contact resistivity between the metal gridlines and the semiconductor, the line resistance of the gridlines, and sheet resistances of various conductive layers for both R&D experiments and factory QC.

PL Applications​

See our Custom EL/PL Solutions for any shape/size/orientation application

After diffusion

After selective emitter

After rear passivation

After front passivation

Finished PERC cell

Finished IBC cell

EL Applications ​

Inject current via clipping to wires, probing pads, chuck busbar probing, or multiplexed probing of arrays of thin-film cells

Inactive Cracked Segments

Reverse bias EL shunt map

Chuck EL PERC

CdTe

CIGS

perovskites

UVF Applications​

The UV Fluorescence technique works with panels that have polymer backsheets. Fluorophores are contained in panel encapsulants and backsheets – leading to fluorescence in the visible spectrum when exposed to UV light.

Front Encapsulant BOM variations

Backsheet BOM Variations

Gridline
Corrosion

Edge Seal
Problem

Non-uniform Lamination

Cell Cracking
Dating

Hotspots and Yellowing

J-box Seal
Problem

decades of experience and hundreds of customers

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BrightSpot Automation global presence in PV imaging tools

IMPEL Software

Control

IMPEL is the unified control platform for BrightSpot imaging systems, enabling seamless coordination of camera, light sources, and power supply. From a single interface, users can adjust exposure settings, trigger PL or EL sequences, and automate capture workflows across multiple system components.

Enhancement

Built-in image processing tools help users sharpen contrast, highlight defects, and visualize subtle variations in cell or panel performance. With support for custom filters and multispectral imaging, IMPEL ensures every captured frame delivers actionable insights, whether in R&D or field diagnostics.

Report

IMPEL simplifies documentation by generating detailed reports with embedded images, metadata, and measurement context. Export results for internal QA, client acceptance, or long-term traceability – standardized and ready to share.

Publications

Here you’ll find white papers, case studies, and expert commentary designed to provide practical takeaways for professionals and decision-makers

Customized Defect Imaging Solutions for Perovskite and Tandem Cell/Panel Architectures

UV Fluorescence Imaging Of Defects And Bill Of Materials Variations In Bifacial Solar Panels

EUPVSEC – Bilbao, Spain – Sep 22, 2025

Ultraviolet Fluorescence Imaging for Photovoltaic Module Metrology: Best Practices and Survey of Features Observed in Fielded Modules

IEEE Journal of Photovoltaics ( Volume: 15, Issue: 3, May 2025)

Low-Cost Daytime Electroluminescence Imaging

NREL PV Reliability Workshop – Lakewood, CO USA – Mar 6, 2025

UV Fluorescence Imaging for Solar Panel Product Development and Durability Testing

NREL PV Reliability Workshop – Lakewood, CO USA – Feb 28, 2024

Unveiling the Unseen: Harnessing UV Fluorescence for Comprehensive Rooftop PV System Assessment and Successful Insurance Claims Process

NREL PV Reliability Workshop – Lakewood, CO USA – Feb 28, 2024

Detection and Impact of Cracks Hidden Near Interconnect Wires in Silicon Solar Cells

50th IEEE PVSC, Jun 12 2023

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