BrightSpot Automation serves the entire Perovskite PV value chain with a suite of metrology tools implemented from R&D to product development to manufacturing to field testing. Our systems help identify defects, improve quality, reduce investment risk, and extend the performance of PV technology throughout its lifecycle. BrightSpot supplies customized Photoluminescence (PL) and Electroluminescence (EL) imaging tools which assess device spatial uniformity and resolve defects such as pinholes between the Perovskite film and carrier transport layers. Such pinholes may cause shunts that reduce fill factor and increase sensitivity to reverse bias damage. BrightSpot also supplies UV Fluorescence (UVF) tools which reveal the effects of moisture ingress due to incomplete sealing.