The primary application of UV Fluorescence (UVF) imaging to date has been to detect defects and bill of materials variations in aged silicon solar panels in the field.  We demonstrate here the application of UVF for imaging defects in solar panels after environmental chamber testing.  Commercial panels that underwent chamber exposure at NREL were tested with a UVF camera system to examine defects such as cracked cells.  New single cell encapsulated coupons with different encapsulant and backsheet materials were fabricated at NREL, and these were also imaged with the UVF camera system to look at changes before and after encapsulation.  We see complementary information from UVF as compared to EL testing that justifies its use after most environmental chamber tests for panel designs using fluorescing encapsulants.  For panel designs that don’t use fluorescing encapsulants, substituting a fluorescing encapsulant for some stages of product development may be advantageous for detecting some defects such sealing problems and hidden cracks under wires.